No. | Topic | Lecture Notes |
---|---|---|
  | INTRODUCTION |   |
1 | Intro, Cost of Testing | lec01.pdf |
2 | Testing Tradeoffs, IDDQ Testing, Intro to Simulation | lec02.pdf |
  | LOGIC SIMULATION |   |
3 | Logic Simulation II | lec03.pdf |
  | FAULT MODELING |   |
4 | Fault Modeling I | lec04.pdf |
5 | Fault Modeling II | lec05.pdf |
  | FAULT SIMULATION & COVERAGE ESTIMATION |   |
6 | Fault Simulation I | lec06.pdf |
7 | Fault Simulation II | lec07.pdf |
8 | Fault Grading, Coverage Estimation | lec08.pdf |
  | TEST GENERATION FOR STUCK-AT FAULTS |   |
9 | Combinational ATPG I | lec09.pdf |
10 | Combinational ATPG II | lec10.pdf |
11 | Advanced Combinational ATPG | lec11.pdf |
12 | Combinational Test Compaction, Sequential ATPG | lec12.pdf |
13 | Sequential ATPG II | lec13.pdf |
14 | Sequential Test Compaction | lec14.pdf |
15 | Untestable Fault Identification | lec15.pdf |
  | TEST GENERATION FOR OTHER FAULT MODELS |   |
16 | Bridging and Delay Fault Testing | lec16.pdf |
17 | More Delay Fault and Functional Testing | lec17.pdf |
18 | High-Level Testing | lec18.pdf |
  | DESIGN FOR TESTABILITY |   |
19 | Design For Testability I | lec19.pdf |
20 | Design For Testability II | lec20.pdf |
21 | Built-In Self-Test | lec21.pdf |
22 | Memory & SOC Testing | lec22.pdf |
  | DEBUGGING AND DIAGNOSIS |   |
23 | Yield Optimization and Diagnosis | lec23.pdf |
24 | Diagnosis II | lec24.pdf |
  | ADDITIONAL TOPICS |   |
25 | Mixed-Signal Test | lec25.pdf |
26 | Project Presentations |   |