| No. | Topic | Lecture Notes |
|---|---|---|
| INTRODUCTION | ||
| 1 | Intro, Cost of Testing | lec01.pdf |
| 2 | Testing Tradeoffs, IDDQ Testing, Intro to Simulation | lec02.pdf |
| LOGIC SIMULATION | ||
| 3 | Logic Simulation II | lec03.pdf |
| FAULT MODELING | ||
| 4 | Fault Modeling I | lec04.pdf |
| 5 | Fault Modeling II | lec05.pdf |
| FAULT SIMULATION & COVERAGE ESTIMATION | ||
| 6 | Fault Simulation I | lec06.pdf |
| 7 | Fault Simulation II | lec07.pdf |
| 8 | Fault Grading, Coverage Estimation | lec08.pdf |
| TEST GENERATION FOR STUCK-AT FAULTS | ||
| 9 | Combinational ATPG I | lec09.pdf |
| 10 | Combinational ATPG II | lec10.pdf |
| 11 | Advanced Combinational ATPG | lec11.pdf |
| 12 | Combinational Test Compaction, Sequential ATPG | lec12.pdf |
| 13 | Sequential ATPG II | lec13.pdf |
| 14 | Sequential Test Compaction | lec14.pdf |
| 15 | Untestable Fault Identification | lec15.pdf |
| TEST GENERATION FOR OTHER FAULT MODELS | ||
| 16 | Bridging and Delay Fault Testing | lec16.pdf |
| 17 | More Delay Fault and Functional Testing | lec17.pdf |
| 18 | High-Level Testing | lec18.pdf |
| DESIGN FOR TESTABILITY | ||
| 19 | Design For Testability I | lec19.pdf |
| 20 | Design For Testability II | lec20.pdf |
| 21 | Built-In Self-Test | lec21.pdf |
| 22 | Memory & SOC Testing | lec22.pdf |
| DEBUGGING AND DIAGNOSIS | ||
| 23 | Yield Optimization and Diagnosis | lec23.pdf |
| 24 | Diagnosis II | lec24.pdf |
| ADDITIONAL TOPICS | ||
| 25 | Mixed-Signal Test | lec25.pdf |
| 26 | Project Presentations |