PROACTIVE Research Publications

Page that lists the publications according to the research areas.

Book Chapters
1. "Delay Testing,"
   Duncan M. Walker and Michael S. Hsiao,
   book chapter in System-on-Chip Test Architectures, edited by Laung-Terng Wang, Charles E. Stroud, and Nur A. Touba, Morgan Kaufmann, San Francisco, CA, pp. 263-306, 2007.
2. "Test Generation,"
   Michael S. Hsiao,
   book chapter in VLSI Test Principles and Architectures, edited by Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen, Morgan Kaufmann, San Francisco, CA, pp. 161-262, 2006.
3. "Verification of Large Scale Nano Systems with Unreliable Nano Devices,"
   Michael S. Hsiao, Shuo Sheng, Rajat Arora, Ankur Jain, and Vamsi Boppana,
   book chapter in Nano, Quantum and Molecular Computing: Implications to High Level Design and Validation, edited by Sandeep Shukla and R. Iris Bahar, Kluwer Academic Publishers, Boston, MA, pp. 323-351, 2004.
4. "Peak Power Estimation,"
   Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
   book chapter in Genetic Algorithms for VLSI Design, Layout, and Test Automation, edited by P. Mazumder and E. M. Rudnick, Prentice Hall, Upper Saddle River, NJ, pp. 227-251, 1999.
5. "Automatic Test Generation,"
   Elizabeth M. Rudnick, Michael S. Hsiao, and Janak H. Patel,
   book chapter in Genetic Algorithms for VLSI Design, Layout, and Test Automation, edited by P. Mazumder and E. M. Rudnick, Prentice Hall, Upper Saddle River, NJ, pp. 158-226, 1999.

   Refereed Journal and Conference Publications

6. "Boosting SAT solver performance via a new hybrid approach,"
   Lei Fang and Michael S. Hsiao,
   accepted to Journal on Satisfiability, Boolean Modeling and Computation, 2008.
7. "SAT-based state justification with adaptive mining of invariants,"
   Weixin Wu and Michael S. Hsiao,
   to appear in International Test Conf., October 2008.
8. "A new testability guided abstraction to solving bit-vector formula,"
   Nannan He and Michael S. Hsiao,
   to appear in International Workshop on Bit-Precise Reasoning, July 2008.
9. "On providing automatic parental consent over information collection from children,"
   Karthik Channakeshava, Kaigui Bian, Michael S. Hsiao, Jung-Min Park, Robert Crossler, France Belanger, Payal Aggarwal, and Janine Hiller,
   to appear in International Conference on Security and Management (SAM), July 2008.
10. "A new scan architecture for both low power testing and test volume compression under SOC test environment,"
    Hong-Sik Kim, Sungho Kang, and Michael S. Hsiao,
    accepted to Journal of Electronic Testing: Theory and Applications, 2008.
11. "Bilateral testing of nano-scale fault-tolerant circuits,"
    Lei Fang and Michael S. Hsiao,
    Journal of Electronic Testing: Theory and Applications, vol. 24, no. 1-3, June, 2008, pp. 285-296.
12. "A region based approach for the identification of hardware trojans,"
    Mainak Banga and Michael S. Hsiao,
    in Proceedings of the Hardware-Oriented Security and Trust Workshop, June 2008.
13. "A new hybrid static/run-time secure memory access protection,"
    Nannan He, Xueqi Cheng, and Michael S. Hsiao,
    in Proceedings of IEEE International Conf. on Technologies for Homeland Security, May 2008.
14. "A new security sensitivity measurement for software variables,"
    Xueqi Cheng, Nannan He, and Michael S. Hsiao,
    in Proceedings of IEEE International Conf. on Technologies for Homeland Security, May 2008.
15. "SAT-based equivalence checking of threshold logic designs for nanotechonologies," (pdf)
    Yexin Zheng, Michael S. Hsiao, and Chao Huang,
    in Proceedings of the IEEE/ACM Great Lakes Symposium on VLSI, April 2008, pp. 225-230.
16. "Guided test generation for isolation and detection of embedded trojans in ICs," (pdf)
    Mainak Banga, Maheshwar Chandrasekar, Lei Fang, and Michael S. Hsiao,
    in Proceedings of the IEEE/ACM Great Lakes Symposium on VLSI, April 2008, pp. 363-366.
17. "Efficient design validation based on cultural algorithms," (pdf)
    Weixin Wu and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2008, pp. 402-407.
18. "Simulation-directed invariant mining for software verification," (pdf)
    Xueqi Cheng and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2008, pp. 682-687.
19. "A fast approximation algorithm for MIN-ONE SAT," (pdf)
    Lei Fang and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2008, pp. 1087-1090.
20. "Mining global constraints with domain knowledge for improving bounded sequential equivalence checking," (pdf)
    Weixin Wu and Michael S. Hsiao,
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 27, no. 1, Jan. 2008, pp. 197-201.
21. "Hybrid testing and verification techniques for a cognitive radio system,"
    Xueqi Cheng, Nannan He, and Michael S. Hsiao,
    in Proceedings of the International Conf. on Software Engineering and Applications, November 2007, pp. 240-245.
22. "Mining-guided state justification with partitioned navigation tracks," (pdf)
    Ankur Parikh, Weixin Wu, and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conference, Oct. 2007.
23. "Efficient power droop aware delay fault testing," (pdf)
    Bin Li, Lei Fang, and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conference, Oct. 2007.
24. "Bounded model checking of embedded software in wireless cognitive radio systems" (pdf)
    Nannan He and Michael S. Hsiao,
    in Proceedings of the IEEE International Conference on Computer Design, Oct., 2007, pp. 19-24.
25. "Mining sequential constraints for pseudo-functional testing," (pdf)
    Weixin Wu and Michael S. Hsiao,
    in Proceedings of the IEEE Asian Test Symposium, Oct., 2007, pp. 19-24.
26. "Parents and the internet: privacy awareness, practices, and control,"
    Robert E. Crossler, France Bélanger, Janine S. Hiller, Payal Aggarwal, Karthik Channakeshava, Kaigui Bian, Jung-Min Park, and Michael S. Hsiao,
    in Proceedings of the America's Conference on Information Systems (AMCIS), Keystone, Colorado, August 2007.
27. "Integrating validation and verification in the digital design curriculum," (pdf)
    Shrirang Yardi and Michael S. Hsiao,
    in Proceedings of the International Conference on Microelectronic Systems Education, June 2007, pp. 143-144.
28. "Efficient search space pruning for multi valued SAT based ATPG,"
    Maheshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE European Test Symposium, May, 2007.
29. "Using scan-dump values to improve functional-diagnosis methodology," (pdf)
    Vishnu Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, and Kai Yang,
    in Proceedings of the IEEE VLSI Test Symposium, May, 2007, pp. 231-238.
30. "An overlapping scan architecture for reducing both test time & test power by pipelining fault detection," (pdf)
    Xiaoding Chen and Michael S. Hsiao,
    in IEEE Transactions on VLSI Systems, vol. 15, no. 4, April 2007, pp. 404-412.
31. "A new hybrid solution to boost SAT solver performance," (pdf)
    Lei Fang and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2007, pp. 1307-1313.
32. "Explicit safety property strengthening in SAT-based induction," (pdf)
    Vishnu Vimjam and Michael S. Hsiao,
    in Proceedings of the IEEE International Conf. VLSI Design, January 2007, pp. 63-68.
33. "A framework for automatic design validation of RTL circuits via ATPG techniques," (pdf)
    Liang Zhang, Indradeep Ghosh, and Michael S. Hsiao,
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 11, November 2006, pp. 2526-2538.
34. "A new simulation-based property checking algorithm based on partitioned alternative search space traversal," (pdf)
    Qingwei Wu and Michael S. Hsiao,
    in IEEE Transactions on Computers, vol. 55, no. 11, November, 2006, pp. 1325-1334.
35. "Using symbolic simulation and weakening abstraction for formal verification of embedded software,"
    Nannan He and Michael S. Hsiao,
    in Proceedings of the International Conf. on Software Engineering and Applications, November 2006, pp. 334-339.
36. "Simulation-based internal variable range coverage metric and test generation model,"
    Xueqi Cheng and Michael S. Hsiao,
    in Proceedings of the International Conf. on Software Engineering and Applications, November 2006, pp. 352-357.
37. "Characteristic states & cooperative game based search for efficient sequential ATPG and design validation," (pdf)
    Xiaoding Chen and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conf., paper 24.2, October 2006.
38. "A study of implication based pseudo functional testing," (pdf)
    Manan Syal, Kameshwar Chandrasekar , Vishnu Vimjam, Michael S. Hsiao, Yi-Shing Chang, and Sreejit Chakravarty,
    in Proceedings of the IEEE International Test Conf., paper 24.3, October 2006.
39. "Bilateral testing of nano-scale fault-tolerant circuits," (pdf)
    Lei Fang and Michael S. Hsiao,
    in Proceedings of the IEEE Defect and Fault Tolerance Conf., October 2006, pp. 309-317.
40. "Implicit search-space aware cofactor expansion: a novel preimage computation technique,"
    Kameshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE International Conf. on Computer Design, October 2006.
41. "State variable extraction and partitioning to reduce problem complexity for ATPG and design validation," (pdf)
    Qingwei Wu and Michael S. Hsiao,
    in the IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 25, no. 10, Oct. 2006, pp. 2275-2282.
42. "Fast illegal state identification for improving SAT-based induction," (pdf)
    Vishnu Vimjam and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation Conf., July 2006, pp. 241-246.
43. "Mining global constraints for improving bounded sequential equivalence checking," (pdf)
    Weixin Wu and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation Conf., July 2006, pp. 743-748.
44. "New techniques for untestable fault identification in sequential circuits," (pdf)
    Manan Syal and Michael S. Hsiao,
    in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 6, pp. 1117-1131, June, 2006.
45. "Efficient fault collapsing via generalized dominance relations," (pdf)
    Vishnu Vimjam and Michael S. Hsiao,
    in Proceedings of the IEEE VLSI Test Sympium, April 2006, pp. 258-263.
46. "Testing embedded sequential cores in parallel using spectrum-based BIST," (pdf)
    Xiaoding Chen and Michael S. Hsiao,
    in the IEEE Transactions on Computers, vol. 55, no. 2, pp. 150-162, February 2006.
47. "Untestable multi-cycle path delay faults in industrial designs," (pdf)
    Manan Syal, Suriyaprakash Natarajan, Sreejit Chakravarty, and Michael S. Hsiao,
    in Proceedings of the IEEE Asian Test Symp., December 2005, pp. 194-201.
48. "A novel transition fault ATPG that reduces yield loss," (pdf)
    Xiao Liu and Michael S. Hsiao,
    in the IEEE Design & Test of Computers, vol. 22, no. 6, pp. 576-584, November-December, 2005.
49. "Increasing the deductibility in CNF instances for efficient SAT-based bounded model checking," (pdf)
    Vishnu Vimjam and Michael S. Hsiao,
    in Proceedings of the IEEE High Level Design Validation and Test Workshop, November 2005, pp. 184-191.
50. "A new simulation-based property checking algorithm based on partitioned alternative search space traversal," (pdf)
    Qingwei Wu and Michael S. Hsiao,
    in Proceedings of the IEEE High Level Design Validation and Test Workshop, November 2005, pp. 121-126.
51. "VERISEC: VERIfying Equivalence of SEquential Circuits using SAT," (pdf)
    Manan Syal and Michael S. Hsiao,
    in Proceedings of the IEEE High Level Design Validation and Test Workshop, November 2005, pp. 52-59.
52. "Interleaved invariant checking with dynamic abstraction,"
    Liang Zhang, Mukul R Prasad, and Michael S. Hsiao,
    in Proceedings of the ACM Conf. on Correct Hardware Design and Verification Methods, October 2005, pp. 81-96.
53. "State set management for SAT-based unbounded model checking," (pdf)
    Kameshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE International Conference on Computer Design, October 2005, pp. 585-590.
54. "Extended forward implications and dual recurrence relations to identify sequentially untestable faults," (pdf)
    Manan Syal, Rajat Arora, and Michael S. Hsiao,
    in Proceedings of the IEEE International Conference on Computer Design, October 2005, pp. 453-460.
55. "A formal framework for modeling and analysis of system-level dynamic power management," (pdf)
    Shrirang Yardi, Karthik Channakeshava, Michael S. Hsiao, Thomas Martin, and Dong S. Ha,
    in Proceedings of the IEEE International Conference on Computer Design, October 2005, pp. 119-126.
56. "Region-level approximate computation reuse for power reduction in multimedia applications," (pdf)
    Xueqi Cheng and Michael S. Hsiao,
    in Proceedings of the IEEE/ACM International Symposium on Low Power Electronics and Design, August 2005, pp. 119-122.
57. "Dynamic abstraction using SAT-based BMC," (pdf)
    Liang Zhang, Mukul R. Prasad, Michael S. Hsiao, and Thomas Sidle,
    in the IEEE/ACM Design Automation Conference, June 2005, pp. 754-757.
58. "Two-tier testing of circuits with embedded nano blocks,"
    Lei Fang and Michael S. Hsiao,
    in the Proceedings of the IEEE International Workshop on Design and Test of Defect-Tolerant Nanoscale Architectures, May 2005, pp. 4.17-4.23.
59. "Efficient techniques for transition testing," (pdf)
    Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, and Paul J. Thadikaran,
    in the ACM Transactions on Design Automation of Electronic Systems, vol. 10, no. 2, pp. 258-278, April 2005.
60. "Forward image computation with backtracing ATPG and incremental state-set construction," (pdf)
    Kameshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE/ACM Great Lakes Symposium on VLSI, April 2005, pp. 254-259.
61. "An effective and efficient ATPG-based combinational equivalence checker," (pdf)
    Ronald P. Lajaunie and Michael S. Hsiao,
    in Proceedings of the IEEE/ACM Great Lakes Symposium on VLSI, April 2005, pp. 248-253.
62. "Untestable fault identification through enhanced necessary value assignments," (pdf)
    Vishnu C. Vimjam, Manan Syal, and Michael S. Hsiao,
    in Proceedings of the IEEE/ACM Great Lakes Symposium on VLSI, April 2005, pp. 176-181.
63. "Error diagnosis of sequential circuits using region-based model," (pdf)
    Anand Lloyd D'Souza and Michael S. Hsiao,
    in the Journal of Electronic Testing Theory and Applications, vol. 21, no. 2, pp. 115-126, April 2005.
64. "Reduce testing time by partitioning the scan flops and pipelining excitation and propagation of different fault sets,"
    Xiaoding Chen and Michael S. Hsiao,
    in IEEE International Test Synthesis Workshop, April 2005.
65. "Integration of learning techniques into incremental satisfiability for efficient path-delay fault test generation," (pdf)
    Kameshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2005, pp. 1002-1007.
66. "Quality-driven proactive computation elimination for power-aware multimedia processing," (pdf)
    Shrirang Yardi, Michael S. Hsiao, Thomas Martin, and Dong Ha,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2005, pp. 340-345.
67. "Towards an intrusion detection system for battery exhaustion attacks on mobile computing devices," (pdf)
    Daniel Nash, Thomas Martin, Dong Ha, and Michael S. Hsiao,
    in Proceedings of the International Workshop on Pervasive Computing and Communication Security, March 2005, pp. 141-145.
68. "Q-PREZ: QBF evaluation using partition, resolution and elimination with ZBDDs," (pdf)
    Kameshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE VLSI Design Conference, January 2005, pp. 189-194.
69. "Using global structural relationships of signals to accelerate SAT-based combinational equivalence checking," (pdf)
    Rajat Arora and Michael S. Hsiao,
    in the Journal of Universal Computer Science, vol. 10, no. 12, pp. 1597-1628, December 2004.
70. "Success-driven learning in ATPG for preimage computation," (pdf)
    Shuo Sheng and Michael S. Hsiao,
    in the IEEE Design & Test of Computers, vol. 21, no. 6, pp. 504-512, November-December 2004.
71. "On identifying functionally untestable transition faults," (pdf)
    Xiao Liu and Michael S. Hsiao,
    in Proceedings of the IEEE High-Level Design Validation and Test Workshop, November 2004, pp. 121-126.
72. "CNF formula simplification using implication reasoning," (pdf)
    Rajat Arora and Michael S. Hsiao,
    in Proceedings of the IEEE High-Level Design Validation and Test Workshop, November 2004, pp. 129-134.
73. "Incremental deductive and inductive reasoning for SAT-based bounded model checking," (pdf)
    Liang Zhang, Mukul R. Prasad, and Michael S. Hsiao,
    in Proceedings of the IEEE International Conference on Computer Aided Design, November 2004, pp. 502-509.
74. "Decision selection and learning for an 'all solutions ATPG engine', " (pdf)
    Kameshwar Chandrasekar and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conference, October 2004, pp. 607-616.
75. "State variable extraction to reduce problem complexity for ATPG and design validation," (pdf)
    Qingwei Wu and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conference, October 2004, pp. 820-829.
76. "ALAPTF: A new transition fault model and the ATPG algorithm," (pdf)
    Puneet Gupta and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conference, October 2004, pp. 1053-1060.
77. "Identifying untestable transition faults in latch based designs with multiple clocks," (pdf)
    Manan Syal, Sreejit Chakravarty, and Michael S. Hsiao,
    in Proceedings of the IEEE International Test Conference, October 2004, pp. 1034-1043.
78. "Incrementally improving SAT-based bounded model checking,"
    Liang Zhang, Mukul R. Prasad, and Michael S. Hsiao,
    in the IEEE International Workshop on Logic and Synthesis, June 2004.
79. "Efficient ATPG for design validation based on partitioned state exploration histories," (pdf)
    Qingwei Wu and Michael S. Hsiao,
    in Proceedings of the IEEE VLSI Test Symposium, April 2004, pp. 389-394.
80. "ALAPT: A new transition fault model for small delay faults,"
    Puneet Gupta and Michael S. Hsiao,
    International Test Synthesis Workshop, March 2004.
81. "Denial-of-service attacks on battery-powered mobile computers," (pdf)
    Thomas Martin, Michael S. Hsiao, Dong Ha, and Jayan Krishnaswami,
    in Proceedings of the IEEE International Conference on Pervasive Computing and Communications, March, 2004, pp. 309-318.
82. "A novel SAT all-solutions solver for efficient preimage computation," (pdf)
    Bin Li, Michael S. Hsiao, and Shuo Sheng
    in Proceedings of the IEEE/ACM Design Automation and Test in Europe (DATE) Conference, February, 2004, pp. 272-277.
83. "Can SAT be used to improve sequential ATPG methods?" (pdf)
    Mukul R. Prasad, Michael S. Hsiao, and Jawahar Jain,
    in Proceedings of the IEEE VLSI Design Conference, January, 2004, pp. 585-590.
84. "Untestable fault identification using recurrence relations and impossible value assignments," (pdf)
    Manan Syal and Michael S. Hsiao,
    in Proceedings of the IEEE VLSI Design Conference, January, 2004, pp. 481-486.
85. "Enhancing SAT-based bounded model checking using sequential logic implications," (pdf)
    Rajat Arora and Michael S. Hsiao,
    in Proceedings of the IEEE VLSI Design Conference, January, 2004, pp.784-787.
86. "Automatic design validation framework for HDL description via RTL ATPG," (pdf)
    Liang Zhang, Michael S. Hsiao, and Indradeep Ghosh,
    Proceedings of the IEEE Asian Test Symposium, November 2003, pp. 148-153.
87. "ATPG-based preImage computation: efficient search space pruning with ZBDD," (pdf)
    Kameshwar Chandrasekar and Michael S. Hsiao,
    Proceedings of the IEEE High-Level Design Validation and Test Workshop, November 2003, pp. 117-122.
88. "Enhancing SAT-based equivalence checking with static logic implications," (pdf)
    Rajat Arora and Michael S. Hsiao,
    Proceedings of the IEEE High-Level Design Validation and Test Workshop, November 2003, pp. 63-68.
89. "Constrained ATPG for broadside transition testing," (pdf)
    Xiao Liu and Michael S. Hsiao,
    in Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2003, pp. 175-182.
90. "Efficient sequential ATPG based on partitioned finite-state-machine traversal," (pdf)
    Qingwei Wu and Michael S. Hsiao,
    Proceedings of the IEEE International Test Conference, September, 2003, pp. 281-289.
91. "Efficient sequential ATPG for functional RTL circuits," (pdf)
    Liang Zhang, Indradeep Ghosh, and Michael S. Hsiao,
    Proceedings of the IEEE International Test Conference, September, 2003, pp. 290-298.
92. "High quality ATPG for delay defects," (pdf)
    Puneet Gupta and Michael S. Hsiao,
    Proceedings of the IEEE International Test Conference, September, 2003, pp. 584-591.
93. "Efficient transition fault ATPG algorithms based on stuck-at test vectors," (pdf)
    Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, and Paul J. Thadikaran,
    in the Journal of Electronic Testing Theory and Applications, vol. 19, no. 4, pp. 437-445, August, 2003.
94. "A novel ATPG for formal verification,"
    Shuo Sheng and Michael S. Hsiao,
    Proceedings of the IEEE Microprocessor Test and Verification Workshop, May 2003.
95. "Efficient implication-based untestable bridge fault identifier," (pdf)
    Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, and Sreejit Chakravarty,
    Proceedings of the IEEE VLSI Test Symposium, April 2003, pp. 393-398.
96. "Energy-efficient logic BIST based on state correlation analysis," (pdf)
    Xiaoding Chen and Michael S. Hsiao,
    Proceedings of the IEEE VLSI Test Symposium, April 2003, pp. 267-272.
97. "High quality delay testing,"
    Puneet Gupta and Michael S. Hsiao,
    Proceedings of the IEEE Concurrent and Defect-Based Testing Workshop, April 2003.
98. "High-level automatic test generation for design verification,"
    Liang Zhang, Michael S. Hsiao, and Indradeep Ghosh,
    10th IEEE International Test Synthesis Workshop, March, 2003.
99. "Efficient preimage computation using a novel success-driven ATPG," (pdf)
    Shuo Sheng and Michael S. Hsiao,
    in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2003, pp. 822-827.
100. "A novel, low-cost algorithm for sequentially untestable fault identification," (pdf)
     Manan Syal and Michael S. Hsiao,
     in Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2003, pp. 316-321.
101. "Behavioral-level DFT via formal operator testability measures," (pdf)
     Sandhya Seshadri and Michael S. Hsiao
     in the Journal of Electronic Testing Theory and Applications, vol. 18, no. 6, pp. 595-611, December, 2002.
102. "Characteristic faults and spectral information for logic BIST," (pdf)
     Xiaoding Chen and Michael S. Hsiao,
     Proceedings of the IEEE International Conference on Computer-Aided Design, November 2002, pp. 294-298.
103. "Reducing power consumption by utilizing retransmission in short range wireless network," (pdf)
     Yufeng Zhao and Michael S. Hsiao,
     Proceedings of the IEEE Conference on Local Computer Networks, November 2002, pp. 527-533.
104. "Techniques to reduce data volume and application time for transition test,'' (pdf)
     Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, and Paul J. Thadikaran,
     Proceedings of the IEEE International Test Conference, October 2002, pp. 983-992.
105. "Efficient sequential test generation based on logic simulation," (pdf)
     Shuo Sheng and Michael S. Hsiao,
     in the IEEE Design and Test of Computers, vol. 19, no. 5, pp. 56-64, September-October, 2002.
106. "Genetic spot optimization for peak power estimation in large VLSI circuits," (pdf)
     Michael S. Hsiao,
     in VLSI Design, vol. 15, no. 1, pp. 407-416, August 2002.
107. "Effective safety property checking based on simulation-based ATPG," (pdf)
     Shuo Sheng, Koichiro Takayama, and Michael S. Hsiao,
     Proceedings of the IEEE Design Automation Conference, June 2002, pp. 813-818.
108. "Improving sequential ATPG using SAT methods,"
     Mukul R. Prasad, Michael S. Hsiao, and Jawahar Jain,
     Proceedings of the IEEE/ACM International Workshop on Logic & Synthesis, June 2002.
109. "Novel ATPG algorithm for transition faults," (pdf)
     Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, and Paul J. Thadikaran,
     Proceedings of the IEEE European Test Workshop, May, 2002.
110. "Spectrum-based BIST in complex SOCs," (pdf)
     Ganapathy Kasturirangan and Michael S. Hsiao,
     Proceedings of the IEEE VLSI Test Symposium, April 2002, pp. 111-116.
111. "Maximizing impossibilities for untestable fault identification," (pdf)
     Michael S. Hsiao,
     Proceedings of the IEEE Design Automation and Test in Europe Conference, March, 2002, pp. 949-953.
112. "State and fault information for compaction-based test generation," (pdf)
     Ashish Giani, Shuo Sheng, Michael S. Hsiao, and Vishwani Agrawal,
     in the Journal of Electronic Testing: Theory and Applications, vol. 18, no. 1, pp. 63-72, February, 2002.
113. "A hardware architecture for dynamic performance and energy adaptation," (pdf)
     Phillip Stanley-Marbell, Michael S. Hsiao, and Ulrich Kremer,
     Proceedings of Workshop on Power-Aware Computer Systems (PACS), February 2002, pp. 23-32.
114. "Practical use of sequential ATPG for model checking: going the extra mile does pay off,"
     Michael S. Hsiao and Jawahar Jain,
     Proceedings of the 6th IEEE International Workshop on High Level Design Validation and Test, November, 2001, pp. 39-44.
115. "On efficient error diagnosis of digital circuits," (pdf)
     Nandini Sridhar and Michael S. Hsiao,
     Proceedings of the IEEE International Test Conference, October, 2001, pp. 678-687.
116. "On quality of test sets: relating fault coverage to defect coverage," (pdf)
     Anand Lloyd D'Souza and Michael S. Hsiao,
     in 37th Annual Systems Readiness Technology Conference (AUTOTESTCON), August, 2001.
117. "Fast, flexible, cycle-accurate energy estimation," (pdf)
     Phillip Stanley-Marbell and Michael S. Hsiao,
     Proceedings of the ACM/IEEE International Symposium on Low-Power Electronics and Design, August 2001, pp. 141-146.
118. "Compiler-directed dynamic voltage/frequency scheduling for energy reduction in microprocessors," (pdf)
     Chung-Hsing Hsu, Ulrich Kremer, and Michael S. Hsiao,
     Proceedings of the ACM/IEEE International Symposium on Low-Power Electronics and Design, August 2001, pp. 275-278.
119. "Study of relationship between high level and logic level vector sets,"
     Aaresh Powvalla, Ganapathy Kasturirangan, Liang Zhang, and Michael S. Hsiao,
     in the 10th IEEE North Atlantic Test Workshop, May, 2001.
120. "Novel spectral methods for built-in self-test in a system-on-a-chip environment," (pdf)
     Ashish Giani, Shuo Sheng, Michael S. Hsiao, and Vishwani Agrawal,
     Proceedings of the IEEE VLSI Test Symposium,, April, 2001, pp. 163-168.
121. "Exploring the interaction between Java's implicitly thrown exceptions and instruction scheduling," (pdf)
     Matthew Arnold, Michael S. Hsiao, Ulrich Kremer, and Barbara Ryder,
     in the International Journal of Parallel Programming, vol. 29, no. 2, pp. 111-137, April, 2001.
122. "Embedded core testing using genetic algorithms,"
     Ruofan Xu and Michael S. Hsiao,
     in TAPTechnology, second Edition, pp. 19-25, 2001.
123. "Techniques to improve error diagnosis accuracy and resolution,"
     Nandini Sridhar and Michael S. Hsiao,
     in 8th IEEE International Test Synthesis Workshop, March, 2001.
124. "Efficient spectral techniques for sequential ATPG," (pdf)
     Ashish Giani, Shuo Sheng, Michael S. Hsiao, and Vishwani Agrawal,
     Proceedings of the IEEE Design Automation and Test in Europe Conference, March, 2001, pp. 204-208.
125. "Accurate power macro-modeling techniques for complex RTL circuits," (pdf)
     Nachiketh R. Potlapally, Anand Raghunathan, Ganesh Lakshmininarayana, Michael S. Hsiao, and Srimat T. Chakradhar,
     Proceedings of the IEEE VLSI Design Conference, January, 2001, pp. 235-241.
126. "Error diagnosis of sequential circuits using region-based model," (pdf)
     Anand L. D'Souza and Michael S. Hsiao,
     Proceedings of the IEEE VLSI Design Conference, January, 2001, pp. 103-108.
127. "Combination of structural and state analysis for partial scan," (pdf)
     Sameer Sharma and Michael S. Hsiao,
     Proceedings of the IEEE VLSI Design Conference, January, 2001, pp. 134-139.
128. "Compaction-based test generation using state and fault information," (pdf)
     Ashish Giani, Shuo Sheng, Michael S. Hsiao, and Vishwani Agrawal,
     Proceedings of the IEEE Asian Test Symposium, December, 2000, pp. 159-164.
129. "Embedded core testing using genetic algorithms," (pdf)
     Ruofan Xu and Michael S. Hsiao,
     Proceedings of the IEEE Asian Test Symposium, December, 2000, pp. 254-259.
130. "Compiler-directed dynamic frequency and voltage scheduling," (pdf)
     Chung-Hsing Hsu, Ulrich Kremer, and Michael S. Hsiao,
     Proceedings of Workshop on Power-Aware Computer Systems (PACS), November 2000.
131. "Formal Operator Testability Methods for Behavioral-Level DFT Using Value Ranges," (pdf)
     Sandhya Seshadri and Michael S. Hsiao,
     Proceedings of the 5th IEEE International Workshop on High Level Design Validation and Test, November, 2000.
132. "Peak power estimation of VLSI circuits: new peak power measures," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in the IEEE Transactions of VLSI Systems, vol. 8, no. 4, pp. 435-439, August, 2000.
133. "Test set compaction using relaxed subsequence removal," (pdf)
     Michael S. Hsiao and Srimat T. Chakradhar,
     in the Journal of Electronic Testing: Theory and Applications, vol. 16, no. 4, pp. 319-327, August, 2000.
134. "Test set and fault partitioning techniques for static test sequence compaction of sequential circuits," (pdf)
     Michael S. Hsiao and Srimat T. Chakradhar,
     in the Journal of Electronic Testing Theory and Applications, vol. 16, no. 4, pp. 329-338, August, 2000.
135. "Testing, verification, and diagnosis in the presence of unknowns,"
     Ankur Jain, Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Michael S. Hsiao,
     in TAPTechnology, Launch Edition, pp. 27-33, July, 2000.
136. "Dynamic state traversal for sequential circuit test generation," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in the ACM Transactions on Design Automation of Electronic Systems, vol. 5, no. 3, pp. 548-565, July, 2000.
137. "Correlation-based test generation for sequential circuits,"
     Ashish Giani, Shuo Sheng, Michael S. Hsiao, and Vishwani Agrawal,
     in 9th IEEE North Atlantic Test Workshop, May, 2000, pp. 76-83.
138. "Testing, verification, and diagnosis in the presence of unknowns," (pdf)
     Ankur Jain, Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Michael S. Hsiao, Masahiro Fujita,
     Proceedings of The IEEE VLSI Test Symposium, April, 2000, pp. 263-269.
139. "Fast Defect Coverage Estimation and Diagnosis of Sequential Circuits,"
     Anand L. D'Souza and Michael S. Hsiao,
     in 7th IEEE International Test Synthesis Workshop, March, 2000.
140. "Evaluation for controllability and observability of embedded cores in SOC,"
     Ruofan Xu and Michael S. Hsiao,
     in 7th IEEE International Test Synthesis Workshop, March, 2000.
141. "Correlation analysis of compacted test vectors and the use of correlated vectors for test generation,"
     Shuo Sheng, Ankur Jain, Michael S. Hsiao, and Vishwani Agrawal,
     in 7th IEEE International Test Synthesis Workshop, March, 2000.
142. "Multi-node static logic implications for redundancy identification," (pdf)
     Kabir Gulrajani and Michael S. Hsiao,
     Proceedings of The IEEE Design, Automation, and Test in Europe Conference, Mar., 2000, pp. 729-733.
143. "Formal value-range and variable testability techniques for high-level design-for-testability," (pdf)
     Sandhya Seshadri and Michael S. Hsiao
     in the Journal of Electronic Testing Theory and Applications, vol. 16, no. 1, pp. 131-145, February, 2000.
144. "On non-statistical techniques for fast fault coverage estimation," (pdf)
     Michael S. Hsiao,
     in the Journal of Electronic Testing Theory and Applications, vol. 15, no. 3, pp. 239-254, December 1999.
145. "An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques," (pdf)
     Sandhya Seshadri and Michael S. Hsiao,
     Proceedings of The IEEE International Test Conference, Sept., 1999, pp. 858-867.
146. "Instruction scheduling in the presence of Java's runtime exceptions," (pdf)
     Matthew Arnold, Michael S. Hsiao, Ulrich Kremer, and Barbara Ryder,
     Proceedings of the 12th International Workshop on Languages and Compilers for Parallel Computing, August, 1999.
147. "Partial scan using multi-hop state reachability analysis," (pdf)
     Sameer Sharma and Michael S. Hsiao,
     Proceedings of The IEEE VLSI Test Symposium, April, 1999, pp. 121-126.
148. "On the evaluation of arbitrary defect coverage of test sets," (pdf)
     Ankur Jain, Vamsi Boppana, Michael S. Hsiao, Masahiro Fujita,
     Proceedings of The IEEE VLSI Test Symposium, April, 1999, pp. 426-432.
149. "On using static compaction for weighted random test patterns,"
     Ankur Jain, Vishwani Agrawal, and Michael S. Hsiao,
     6th IEEE International Test Synthesis Workship, March, 1999.
150. "Multi-node static logic implications for redundancy identification,"
     Kabir Gulrajani and Michael S. Hsiao,
     6th IEEE International Test Synthesis Workship, March, 1999.
151. "Peak power estimation using genetic spot optimization for large VLSI circuits," (pdf)
     Michael S. Hsiao,
     Proceedings of the IEEE Design, Automation, and Test in Europe Conference, Mar., 1999, pp. 175-179.
152. "Fast static compaction algorithms for sequential circuit test vectors," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in IEEE Trans. on Computers, vol. 48, no. 3, pp. 311-322, March 1999.
153. "Partitioning and reordering techniques for static test sequence compaction of sequential circuits," (pdf)
     Michael S. Hsiao and Srimat T. Chakradhar,
     Proceedings of the IEEE Asian Test Symposium, Dec., 1998, pp. 452-457.
154. "A fast, accurate, and non-statistical method for fault coverage estimation," (pdf)
     Michael S. Hsiao,
     Proceedings of the IEEE International Conference on Computer Aided Design, Nov. 1998, pp. 155-161.
155. "Crossbar-switch-based microprocessor to exploit ILP,"
     Carlos Parodi, Michael S. Hsiao, and Vishwani Agrawal,
     1998 Mid-Atlantic Student Workshop on Programming Languages and Systems, April, 1998.
156. "Application of genetically-engineered finite-state-machine sequences to sequential circuit ATPG" (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 17, no. 3, pp. 239-254, March 1998.
157. "State relaxation based subsequence removal for fast static compaction in sequential circuits," (pdf)
     Michael S. Hsiao and Srimat T. Chakradhar,
     in Proceedings of the IEEE Design Automation and Test in Europe Conference, Feb., 1998, pp. 577-582.
158. "Partial scan selection based on dynamic reachability and observability information," (pdf)
     Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, and Janak H. Patel,
     Proceedings of the IEEE International Conference on VLSI Design, Jan., 1998, pp. 174-180.
159. "Effects of delay model in peak power estimation of VLSI sequential circuits," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in Proceedings of the IEEE International Conference on Computer Aided Design, Nov., 1997, pp. 45-51.
160. "K2: An estimator for peak sustainable power of VLSI circuits," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in Proceedings of the IEEE International Symposium on Low Power Electronics and Design, Aug., 1997, pp. 178-183.
161. "Partial scan beyond cycle cutting," (pdf)
     Gurjeet S. Saund, Michael S. Hsiao, and Janak H. Patel,
     in Proceedings of the IEEE Fault Tolerant Computing Symposium, Jun., 1997, pp. 320-328.
162. "Partial scan beyond cycle cutting,"
     Gurjeet S. Saund, Michael S. Hsiao, and Janak H. Patel,
     4th International Test Synthesis Workshop, May, 1997
163. "Fast algorithms for static compaction of sequential circuit test vectors," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in Proceedings of the IEEE VLSI Test Symposium, Apr., 1997, pp. 188-195.
164. "Sequential circuit test generation using dynamic state traversal," (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in Proceedings of the IEEE European Design and Test Conference, Mar., 1997, pp. 22-28.
165. "Parallel genetic algorithms for simulation based sequential circuit test generation," (pdf)
     Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Prithviraj Banerjee, and Janak H. Patel,
     in Proceedings of the 10th IEEE International Conference on VLSI Design, Jan., 1997, pp. 475-481.
166. "Automatic test generation using genetically-engineered distinguishing sequences" (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     in Proceedings of the IEEE VLSI Test Symposium, Apr., 1996, pp. 216-223.
167. "Alternating strategies for sequential circuit ATPG" (pdf)
     Michael S. Hsiao, Elizabeth M. Rudnick, and Janak H. Patel,
     Proceedings of the IEEE European Design and Test Conference, Mar., 1996, pp. 368-374.
168. "A new architectural-level fault simulation using propagation prediction of grouped fault-effects" (pdf)
     Michael S. Hsiao and Janak H. Patel,
     in Proceedings of the IEEE International Conference on Computer Design, Oct., 1995, pp. 628-635.

     Theses and Technical Reports

169. "Exploring Constraint Satisfiability Techniques in Formal Verification,"
     Lei Fang,
     Ph.D. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, May 2008.
170. "Discrete Transition System Model and Verification for Mitochondrially Mediated Apoptosis Signaling Pathways,"
     Huy Lam,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, June 2007.
171. "Abstraction Guided Semi-formal Verification,"
     Ankur Parikh,
     M.S. Thesis,, Bradley Department of Electrical and Computer Engineering, Virginia Tech, June 2007.
172. "Strategies for SAT-based formal verification,"
     Vishnu Vimjam,
     Ph.D. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, January 2007.
173. "A complete & practical approach to ensure the legality of a signal transmitted by a cognitive radio,"
     Patrick Cowhig,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, September 2006.
174. "Exploring temporal & spatial correlations on circuit variables for enhancing simulation-based test generation,"
     Xiaoding Chen,
     Ph.D. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, June 2006.
175. "Search-space aware learning technqiues for unbounded model checking and path delay testing,"
     Kameshwar Chandrasekar ,
     Ph.D Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, April 2006.
176. "A new fault model and test generation framework for nanoscale fault-tolerant circuits,"
     Lei Fang and Michael S. Hsiao,
     Technical Report 2006-02-1, PROACTIVE Lab, Virginia Tech, February, 2006.
177. "Static learning for problems in VLSI test and verification,"
     Manan Syal ,
     Ph.D Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, June 2005.
178. "Design verification for sequential systems at various abstraction levels,"
     Liang Zhang,
     Ph.D Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, January 2005.
179. "ATPG and DFT algorithms for delay fault testing,"
     Xiao Liu,
     Ph.D. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, July 2004.
180. "Approximate computation reuse for power reduction of multimedia applications,"
     Xueqi Cheng and Michael S. Hsiao
     Technical Report 2004-07-1, PROACTIVE Lab, Virginia Tech, July, 2004.
181. "Enhancing SAT-based formal verification methods using global learning,"
     Rajat Arora,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, May 2004.
182. "High quality transition and small delay fault ATPG,"
     Puneet Gupta,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, January 2004.
183. "ATPG based preimage computation: efficient search space pruning using ZBDD,"
     Kameshwar Chandrasekar,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, July 2003.
184. "Testing and verification by exploring circuit properties,"
     Shuo Sheng,
     Ph.D. Dissertation, Department of Electrical and Computer Engineering, Rutgers University, July 2003.
185. "Experimental study of scan based transition fault testing techniques,"
     Vinay Jayaram,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, January 2003.
186. "Untestable fault identification using implications,"
     Manan Syal,
     M.S. Thesis, Bradley Department of Electrical and Computer Engineering, Virginia Tech, December 2002.
187. "Estimation of average power consumption by power macro-modeling technique,"
     Hailan Zhu,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, November 2002.
188. "A hardware architecture for dynamic performance and energy adaption,"
     Phillip Stanley-Marbell, Michael S. Hsiao, and Ulrich Kremer,
     Technical Report DCS-TR457, September 2001.
189. "SOC-friendly testing of embedded cores,"
     Aaresh Powvalla,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July, 2001.
190. "Spectral Analysis for Automatic Test Pattern Generation,"
     Ganapathy Kasturirangan,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July, 2001.
191. "Power macromodeling for high level power estimation,"
     Mayuri Vasireddi,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July, 2001.
192. "Hardware and compiler techniques for microprocessor energy reduction,"
     Phillip Stanley-Marbell
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July, 2001.
193. "On efficient error diagnosis of digital circuits,"
     Nandini Sridhar,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, March, 2001.
194. "Fast, cycle-accurate energy estimation for networks of embedded systems,"
     Phillip Stanley-Marbell and Michael S. Hsiao,
     CAIP Technical Report TR-255, Department of Electrical and Computer Engineering, Rutgers University, December, 2000.
195. "Advanced behavioral-level design-for-testability techniques,"
     Sandhya Seshadri,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, November 2000.
196. "Compiler-directed dynamic frequency and voltage scheduling,"
     Chung-Hsing Hsu, Ulrich Kremer, and Michael S. Hsiao,
     Technical Report DCS-TR419, Department of Computer Science, Rutgers University, November 2000.
197. "Accurate power macro-modeling techniques for complex RTL circuits,"
     Nachiketh R. Potlapally, Anand Raghunathan, Ganesh Lakshmininarayana, Michael S. Hsiao, and Srimat T. Chakradhar,
     NEC USA Technical Report 2000-C037-4-5056-3, August, 2000.
198. "High level power estimation techniques,"
     Nachiketh Potlapally,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, August 2000.
199. "Testability evaluation and test generation for system-on-a-chip,"
     Ruofan Xu,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July 2000.
200. "Study of compaction-based ATPG for sequential circuits,"
     Ashish Giani,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, June 2000.
201. "Test quality and error diagnosis using region-based model,"
     Anand Lloyd D'Souza,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, June 2000.
202. "Multi-node implications for sequential circuit reachability analysis and redundancy identification,"
     Kabir Gulrajani,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July 1999.
203. "State analysis based partial scan techniques to explicitly aid sequential test generation,"
     Sameer Sharma,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, July 1999.
204. "On arbitrary defects: modeling and applications,"
     Ankur Jain,
     M.S. Thesis, Department of Electrical and Computer Engineering, Rutgers University, June 1999.
205. "Instruction Scheduling in the Presence of Java's Runtime Exceptions,"
     Matthew Arnold, Michael S. Hsiao, Ulrich Kremer, and Barbara Ryder,
     Department of Computer Science, Rutgers University, Number DCS-TR-384, June, 1999.
206. "A new approach to peak power estimation of VLSI circuits,"
     Michael S. Hsiao,
     CAIP Update,, vol. 11, No. 3, 1998.
207. "Parallel genetic algorithms for sequential circuit test generation,"
     Dilip Krishnaswamy, Michael S. Hsiao, Elizabeth M. Rudnick, Prithviraj Banerjee Janak H. Patel, and Vikram Saxena,
     Technical Report CPDC-TR-9803-018, Northwestern University, 1998.
208. "Partitioning and reordering techniques for static test sequence compaction of sequential circuits,"
     Michael S. Hsiao and Srimat T. Chakradhar,
     NEC USA Tech. Report #97-C074-4-5506-5, November 1997.
209. "State relaxation based subsequence removal for fast static compaction in sequential circuits,"
     Michael S. Hsiao and Srimat T. Chakradhar,
     NEC USA, Tech. Report #97-C053-4-5506-2, September 1997.
210. "Sequential circuit test generation using genetic techniques," (pdf)
     Michael S. Hsiao,
     Ph. D. Dissertation, Department of Electrical and Computer Engineering, Tech. Report CRHC-97-09/UILU-ENG-97-2213, University of Illinois, May, 1997
211. "A genetic-algorithm approach to architectural-level justification of precomputed vectors,"
     Michael S. Hsiao, and Janak H. Patel,
     Coordinated Science Laboratory, University of Illinois, Urbana, IL, Technical Report CRHC-96-2221/UILU-ENG-96-11, Sep., 1996.
212. "Reliability driven synthesis of sequential circuits,"
     Frank F. Hsu, Michael S. Hsiao, and Prithviraj Banerjee,
     Coordinated Science Laboratory, University of Illinois, Urbana, IL, Technical Report CRHC-96-2220/UILU-ENG-96-12, Sep., 1996.
213. "Variable-delay event-driven logic and fault simulation"
     Michael S. Hsiao,
     Master's Thesis, Department of Electrical and Computer Engineering, Tech. Report CRHC-93-14/UILU-ENG-93-2226, University of Illinois, Jun., 1993

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